FT160

Description  of the team

 

Spot XRF (Microspot) thickness analyzers of coatings and materials for rapid quality control testing and validation, making it easy to get the right results in seconds.

X-ray fluorescence (XRF) -based material and coating thickness analysis is a widely accepted and industry-proven analytical technique, offering easy-to-use, rapid, and non-destructive analysis that requires little or no preparation of samples, capable of analyzing solids or liquids in a wide range of elements of  13 to  92U on the periodic table.

FT160