Equipment Description
 XRF Spot Thickness Analyzers (Microspot) for coating and material thickness for rapid quality control testing and validation, making it easy to get the right results in seconds.
 X-ray fluorescence (XRF) -based material and coating thickness analysis is a widely accepted and industry-proven analytical technique, offering easy-to-use, rapid, and non-destructive analysis that requires little or no preparation of samples, capable of analyzing solids or liquids on a wide range of elements from 13Al to 92U in the periodic table.