X-Strata 920

Equipment Description

XRF Spot Thickness Analyzers (Microspot) for coating and material thickness for rapid quality control testing and validation, making it easy to get the right results in seconds.

X-ray fluorescence (XRF) -based material and coating thickness analysis is a widely accepted and industry-proven analytical technique, offering easy-to-use, rapid, and non-destructive analysis that requires little or no preparation of samples, capable of analyzing solids or liquids on a wide range of elements from 13Al to 92U in the periodic table.

X-Strata 920

  • Brand Hitachi
    kind of product

    XRF Analyzer

    Application On table